Electron Microscopy

JEOL 2010 FasTEM - (Room 016B)

This is an advanced state-of-the-art instrument with a 200kV thermionic electron source with four high-resolution CCD cameras which allow images to be acquired digitally. The 2010 FasTEM has an ultra-high resolution pole-piece, giving a lattice resolution of 0.14nm. It is equipped with a Gatan Imaging Filter (GIF 2000), which enables electron energy loss spectroscopy (EELS) and energy filtered imaging to be performed that can dramatically improve image contrast and resolution in the TEM, and allow highly sensitive elemental maps to be obtained. Energy dispersive X-ray  spectroscopy (EDS) can be undertaken using an EDAX Phoenix system. Quantitative and qualitative chemical analysis of materials can be undertaken using either EDS or EELS.

Philips EM420 TEM

The EM420 is equipped with a 120 kV thermionic electron source and provides a lattice resolution of 0.3nm. Accessories include: a STEM system, back-scattered and secondary electron detectors, and a Noran Quest EDS unit. This microscope is ideal for routine TEM investigations, EDS elemental mapping, and for training new TEM users.

TEM sample preparation equipment includes two ion-mills, an electro-polisher, an ultrasonic disc cutter, a precision saw, a dimpling machine, a core drill and a disc punch. Software for the simulation and analysis of lattice images, diffraction patterns and defects is available on both PC and Mac platform.

AMRay 1000A SEM

This SEM is furnished with the Microspec WDX-2A wavelength dispersive X-ray system and the Noran Quantum thin window, energy dispersive X-ray system.  Each SEM system has light element detection capability (Z>4) and can be used to generate quantitative data, X-ray maps, or elemental line scans.

Philips ESEM 2020

The 2020 is an environmental SEM and is equipped with an EDAX CDU/SUTW thin window, energy dispersive X-ray system (Z>4 detection).  Currently, X-ray mapping and line scan generation are not possible with the presently configured system. A Peltier Stage is also available for in-situ experiments.

JEOL 6335F Field Emission SEM

The JSM-6335F is a cold cathode field emission scanning electron microscope. It has a resolution of 1.5nm at 15kV and 5.0nm at 1kV.

The sample stage is fully automated, with computer control of X, Y, Z Tilt and eucentric rotation.