Electron Microscopy

FEI Strata 400S DualBeam - (Room 007B)

The Strata 400 STEM DualBeam system is a fully digital Field Emission Scanning Electron Microscope(FE-SEM) equipped with Focused Ion Beam (FIB) technology and Flipstage/STEM assembly. It allows for complete in-situ TEM/SEM sample preparation, chemical analysis and nano-manufacturing.

FEI Spirit Twin TEM - (Room 016C)

The Tecnai Spirit Twin Transmission Electron Microscope is a general-purpose, high resolution instrument. It is a fully capable TEM/STEM with an EDAX EDS system.

JEOL 2010 FasTEM - (Room 016B)

This is an advanced state-of-the-art instrument with a 200kV thermionic electron source with four high-resolution CCD cameras which allow images to be acquired digitally. The 2010 FasTEM has an ultra-high resolution pole-piece, giving a lattice resolution of 0.14nm. It is equipped with a Gatan Imaging Filter (GIF 2000), which enables electron energy loss spectroscopy (EELS) and energy filtered imaging to be performed that can dramatically improve image contrast and resolution in the TEM, and allow highly sensitive elemental maps to be obtained. Energy dispersive X-ray  spectroscopy (EDS) can be undertaken using an EDAX Phoenix system. Quantitative and qualitative chemical analysis of materials can be undertaken using either EDS or EELS.

JEOL 6335F Field Emission SEM - (Room 016A)

The JSM-6335F is a cold cathode field emission scanning electron microscope. It has a resolution of 1.5nm at 15kV and 5.0nm at 1kV.

The sample stage is fully automated, with computer control of X, Y, Z Tilt and eucentric rotation. Chemical analysis can be performed using a Thermo Noran EDS detector.

Philips ESEM 2020 - (Room 009B)

The 2020 is an environmental SEM and is equipped with an EDAX CDU/SUTW thin window, energy dispersive X-ray system (Z>4 detection).  Currently, X-ray mapping and line scan generation are not possible with the presently configured system. A Peltier Stage is also available for in-situ experiments.