Scanning Probe Microscopy (SPM) allows surface characterization from the micrometer down to the nanometer scale. Although typically used to map topography, SPM can be configured for mapping a wide variety of materials properties.
Asylum Research MFP-3d
This is a cutting edge atomic force microscope (AFM) with sub-nanometer and nanoNewton resolution. The device is presently configured to measure local topography, mechanical compliance, piezoactuation, and electric and magnetic fields. Top and bottom view optics allow precise tip-sample positioning. There is a 100 um maximum lateral scanning range and a vertical range of up to 15 um. Limitations on sample size are approximately 4 cm diameter by 0.8 cm height. |
Asylum Research MFP-3d-IO
This second MFP-3d system is mounted directly on a Nikon inverted optical microscope for simultaneous AFM and bright field optical imaging. A temperature and fluid controller is available, making this instrument ideal for biological or electrochemical investigations. Nanometer scale topography, amplitude, and phase data can therefore be compared with up to 3000x optical images. |
AFM Lithography
 
Both AFM systems feature a customizable lithography suite for precise control of the AFM tip. User programmable loads or biases can be applied at various tip scanning rates with nanometer scale spatial resolution in x, y, and z directions, allowing a range of sample manipulations. As an example, the UConn university seal has been reproduced with dimensions of 4 um on a side.
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Omicron UHV AFM/STM
This high resolution ultra high vacuum unit is capable of atomic scale resolution with atomic force or scanning tunneling microscopy (STM) modes, measured independently or simultaneously. Scanning tunneling spectroscopy additionally allows local electronic states to be probed. |
For more information visit Bryan Huey's website
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University of Connecticut |