June 21st and 22nd, 2017
The goal of this 2 day short course is to familiarize participants with the applications, capabilities, and limitations of common electron microscopes and associated techniques. By the completion of the course, each attendee will have a better understanding of what can be expected of a microscopy services lab, what type of information can be obtained from each instrument/technique, and how to interpret the data provided by electron microscopy.
The techniques discussed in this short course will be Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Energy Dispersive X-ray Spectroscopy (EDXS), and Focused Ion Beam (FIB). The course will familiarize attendees with the basic hardware and functions of the instruments, explain how images are formed and how to interpret them, and provide live demonstrations on each instrument.
- Introduction and Overview of Instrument Hardware
- Sample Preparation and Handling
- Data Acquisition and Interpretation
- Capabilities and Limitations of Techniques
Who Should Attend
This course is intended for non-experts who are responsible for requesting microscope services, or who will be receiving and interpreting results.