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Nano-Measurements

  NanoMeasurement Lab Scheduling

Atomic Resolution and High Speed Atomic Force Microscope for ambient or Ar-purged imaging, AFM with coupled 3-d optical microscopy configured for ambient or in-vitro imaging, AFM for ambient imaging, UHV STM/AFM system, stereo-optical microscope, wet-bench for specimen preparation, and biosafety level 3 certification.

 

Asylum Research Cypher

cypher UConn is proud to be one of the first installation sites worldwide of this next generation atomic force microscope (AFM). The Cypher features picometer resolution with closed loop atomic imaging capabilities, has integrated vibration isolation, and offers a maximum scan range of 30 um (xy) and 5 um (z). The system is devoted to high resolution studies, as well as the development of novel High Speed Surface Property Mapping (HSSPM) capabilities. This system was acquired through an NSF-DMR-IMR-Development grant (0817263), with additional support from the IMS, UConn CMBE Department, UConn School of Engineering, and University of Connecticut Provost’s office.

 

Asylum Research MFP-3d

mfp-3d This is a cutting edge atomic force microscope (AFM) with sub-nanometer and nanoNewton resolution. The device is presently configured to measure local topography, mechanical compliance, piezoactuation, and electric and magnetic fields. Top and bottom view optics allow precise tip-sample positioning. There is a 100 um maximum lateral scanning range and a vertical range of up to 15 um. Limitations on sample size are approximately 4 cm diameter by 0.8 cm height.

 

Asylum Research MFP-3d-IO

mfp-3d-io This second MFP-3d system is mounted directly on a Nikon inverted optical microscope for simultaneous AFM and bright field optical imaging. A temperature and fluid controller is available, making this instrument ideal for biological or electrochemical investigations. Nanometer scale topography, amplitude, and phase data can therefore be compared with up to 3000x optical images.

 

AFM Lithography

afmuconnseal afmlithoAll three AFM systems feature a customizable lithography suite for precise control of the AFM tip. User programmable loads or biases can be applied at various tip scanning rates with nanometer scale spatial resolution in x, y, and z directions, allowing a range of sample manipulations. As an example, the UConn university seal has been reproduced with dimensions of 4 um on a side.

 

Omicron UHV AFM/STM

omicron_uhv This high resolution ultra high vacuum unit is capable of atomic scale resolution with atomic force or scanning tunneling microscopy (STM) modes, measured independently or simultaneously. Scanning tunneling spectroscopy additionally allows local electronic states to be probed.