Dr. Bryan D. Huey
Assistant Professor

University of Connecticut

Department of Chemical, Materials, and Biomolecular Engineering

            and the Institute of Materials Science

Office: IMS room 158

Phone: (860) 486-3284

Lab:     (860) 486-2880
bhuey@ims.uconn.edu
Faculty Web Site


News
·  Recent Publication

·  AFM movies

·  Video/Soundtrack: Intro to Materials Science and to the program at UConn

·  Installation of Combined AFM / 3-d Deconvolution Optics

·  New Group Holiday Card--NanoSleighRide



Teaching
Graduate

·  Microstructural Characterization of Materials, MMAT 322

·  Thin Films and Coatings

Undergraduate

·  Introduction to Structure, Properties, and Processing of Materials II, MMAT 244

·  Nanomaterials: Properties, Characterization, and Applications

Other

·  Intro to Engineering, Engr 100

·  Outreach Efficacy, 1 unit seminar



Outreach
·  Virtual Reality demonstrations and learning games, including VR-AFM

·  Engineering 2000 (E2k), high school summer residential program

·  PLAN Nano, high school science teacher academy: Nanotechnology Theme

·  CT-NanoMinor, State of Connecticut committee, to establish state-wide minor in Nanotechnology



                   

Research Group: Huey AFM Labs
Current
·  Ramesh Nath (PhD)

·  Nicholas Polomoff (PhD)

·  Arron Lucas (PhD)

·  James Bosse (undergraduate)

·  Alex Williams (undergraduate)


Alumni
·  Kate Bagnoli (M.S., now teaching high school)

·  Dr. Minhua Zhao (post-doc, now at NIST/NIH)

·  David Schuman (graduate)

·  Daniel Underhill (undergraduate)

·  Vincent Palumbo (undergraduate)

·  Ali Langston (undergraduate)



Research Interests
Theoretically and experimentally develop and apply variations of Scanning Probe Microscopy (SPM) for nanoscale materials property measurements and mapping.

·  High Speed Surface Property Mapping

·  Mechanical, optical, and coupled properties of biological structures

·  Piezo-Force Microscopy (PFM) for piezoelectric materials

·  Ultrasonic Force Microscopy (UFM) for mechanically heterogeneous systems

·  Scanning Surface Potential Microscopy (SSPM) and Electric Force Microscopy (EFM) for electrically active devices and structures

·  Theory of contrast mechanisms for Atomic Force Microscopy variations

·  Nanofabrication

·  Nanomanipulation



IMS NanoMeasurements Lab
The nm lab features two Asylum Research Atomic Force Microscopes, one designed for further AFM technique development and the other for biological studies.

·  Development:  AFM coupled with extensive test and measurement hardware for development of SPM variations. Includes: function generators; LCR meter; power supplies; 4-ch. oscilloscope; low and high speed lock in amplifiers; spectrum analyzer; thermal/humidity sensor; high speed data acquisition board; custom analysis software; and high speed actuators; computer controlled and automated with Agilent Vee.

·  Bio:  AFM built on an Olympus inverted microscope for simultaneous AFM and optical measurements. Includes oil-coupled 60x objective; high speed, low light, high speed, on chip amplification Hamamatsu camera; broadband illumination with filter selectable excitation; high speed wavelength switching; dual-view detection; automated objective focal adjustment; and Improvision control and analysis software for 4d optical imaging and characterization.

·  We are also installing a Omicron UHV STM/AFM.

nmLabs Microscope Scheduling


Links
·  University of Pennsylvania, MS&E Department, Bonnell Group

·  Oxford University, Department of Materials, Briggs Group

·  Ecole Polytechnic Fédérale de  Lausanne, IPMC, Laszlo Forro Group and Andrzej Kulik

·  National Institute of Standards and Technology, Ceramics Division

·  International Nano/Bio Probes Network



Professional Organizations
·  Materials Research Society
·  American Ceramics Society
·  American Vacuum Society

·  American Physics Society
·  SPIE Smart Structures and Materials

·  IEEE Ultrasonics, Ferroelectrics, and Frequency Control



Annual Holiday Cards
·  2004                        Ferroelectric domain tree, sled, and snowman



·  2005                        AFSM: Atomic Force Snowman Microscopy (Virtual Reality animation of AFM AC-imaging using a snowman’s nose as the tip, in a winter wonderland scene of course). Downloadable as a 1 or 2 player game (play nanoscale king of the snow-covered mountain!)

·  2006                        Let it snow, let it snow, let it snow (Ferroelectric domain nucleation over a holiday pattern as a function of time, set to music).

·  2007                        NanoSleighRide (64 consecutive High Speed PFM images of moving, reindeer-powered, snowman-driven sleigh, to music).



Funding
·  National Science Foundation, Engineering Directorate, Civil, Mechanical and Manufacturing Innovation Division, Nano-Bio-Mechanics

·  Army Research Office
·  UConn Research Foundation




University of Connecticut Seal

Lithographically defined using the AFM

4 µm x 4 µm, Topographic Contrast < 5 nm


Note: Some material is based upon work supported by the National Science Foundation, Engineering Division, Nano-Bio-Mechanics, under Grant No. 0626231. Any opinions, findings and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation (NSF).