Dr. Bryan D. Huey
Assistant Professor
Department of Chemical, Materials, and Biomolecular Engineering
and the Institute of Materials Science
Office: IMS room 158
Phone: (860) 486-3284
Lab: (860) 486-2880
bhuey@ims.uconn.edu
Faculty
Web Site
News
· Recent Publication
· Video/Soundtrack: Intro to Materials
Science and to the program at UConn
· Installation of Combined AFM /
3-d Deconvolution Optics
· New Group Holiday Card--NanoSleighRide
Teaching
Graduate
· Microstructural Characterization of
Materials, MMAT 322
Undergraduate
· Introduction to Structure, Properties,
and Processing of Materials II, MMAT 244
· Nanomaterials: Properties,
Characterization, and Applications
Other
· Intro to Engineering, Engr 100
· Outreach Efficacy, 1 unit seminar
Outreach
· Virtual Reality demonstrations and
learning games, including VR-AFM
· Engineering 2000 (E2k), high school summer residential program
· PLAN Nano, high school science teacher academy: Nanotechnology Theme
· CT-NanoMinor, State of

Research
Group: Huey AFM Labs
Current
· Ramesh Nath (PhD)
· Nicholas Polomoff (PhD)
· Arron Lucas (PhD)
· James Bosse (undergraduate)
· Alex Williams (undergraduate)
Alumni
· Kate Bagnoli (M.S., now teaching high
school)
· Dr. Minhua Zhao (post-doc, now at NIST/NIH)
· David Schuman (graduate)
·
· Vincent Palumbo (undergraduate)
· Ali Langston (undergraduate)
Research Interests
Theoretically and experimentally develop and apply variations of Scanning
Probe Microscopy (SPM) for nanoscale materials property measurements and
mapping.
· High Speed Surface Property Mapping
· Mechanical, optical, and coupled properties of biological structures
· Piezo-Force Microscopy (PFM) for piezoelectric materials
· Ultrasonic Force Microscopy (UFM) for mechanically heterogeneous systems
· Scanning Surface Potential Microscopy (SSPM) and Electric Force Microscopy (EFM) for electrically active devices and structures
· Theory of contrast mechanisms for Atomic Force Microscopy variations
· Nanofabrication
· Nanomanipulation
IMS NanoMeasurements
Lab
The nm lab
features two Asylum Research
Atomic Force Microscopes, one designed for further AFM technique development
and the other for biological studies.
· Development: AFM coupled with extensive test and measurement hardware for development of SPM variations. Includes: function generators; LCR meter; power supplies; 4-ch. oscilloscope; low and high speed lock in amplifiers; spectrum analyzer; thermal/humidity sensor; high speed data acquisition board; custom analysis software; and high speed actuators; computer controlled and automated with Agilent Vee.
· Bio: AFM built on an
· We are also installing a Omicron UHV STM/AFM.
Links
· University
of Pennsylvania, MS&E Department,
Bonnell Group
· Oxford University, Department of Materials, Briggs Group
· Ecole Polytechnic Fédérale de Lausanne, IPMC, Laszlo Forro Group and Andrzej Kulik
· National Institute of Standards and Technology, Ceramics Division
· International Nano/Bio Probes Network
Professional Organizations
· Materials
Research Society
· American
Ceramics Society
· American
Vacuum Society
· American
Physics Society
· SPIE
Smart Structures and Materials
· IEEE Ultrasonics, Ferroelectrics, and Frequency Control
Annual
· 2004 Ferroelectric
domain tree, sled, and snowman

· 2005 AFSM: Atomic Force Snowman Microscopy (Virtual Reality animation of AFM AC-imaging using a snowman’s nose as the tip, in a winter wonderland scene of course). Downloadable as a 1 or 2 player game (play nanoscale king of the snow-covered mountain!)
Funding
· National
Science Foundation, Engineering
Directorate, Civil,
Mechanical and Manufacturing Innovation Division, Nano-Bio-Mechanics
· Army
Research Office
· UConn
Research Foundation

Lithographically defined using the AFM
4 µm x 4
µm, Topographic Contrast < 5 nm
Note: Some material is
based upon work supported by the National Science Foundation, Engineering
Division, Nano-Bio-Mechanics, under Grant No. 0626231. Any opinions, findings
and conclusions or recommendations expressed in this material are those of the
author(s) and do not necessarily reflect the views of the National Science
Foundation (NSF).
