Dr. Bryan D. Huey
Assistant Professor
Department of Chemical, Materials, and Biomolecular Engineering
and the Institute of Materials Science
with courtesy appointment in Physics Dept.
Office: IMS room 158
Phone: (860) 486-3284
Lab: (860) 486-8820 (IMS 22)
bhuey@ims.uconn.edu
Faculty Web Site
News and Events
· June 2009: Lehigh Microscopy School:
Advanced Course on SPM
· March 2009: Visiting postdoc arrives
from Korea Research Institute of Standards and Science
· 2008: Video/Soundtrack: Intro to
Materials Science and to the MS&E program at UConn
Teaching
Graduate
· Microstructural Characterization of
Materials
Undergraduate
· Introduction to Structure, Properties,
and Processing of Materials II
· Nanomaterials: Properties,
Characterization, and Applications
Other
· Intro to Engineering, Engr 100/1000
· Outreach Efficacy, 1 unit seminar
Outreach
· PLAN Nano, high school science teacher academy: Nanotechnology Theme
· Explore Engineering (E2), high school summer residential program introducing Engineering
· Virtual Reality demonstrations and learning games, including VR-AFM
· CT-NanoMinor, State of
UConn
· Materials Research Society student
chapter
Research Group:
Huey AFM Labs
Current
· Dr.
Sungjun Lee (PostDoc, on leave from the Korea Research Institute of
Standards and Science, ‘KRISS’)
· Nicholas Polomoff (PhD)
· Arron Lucas (PhD)
· Vincent Palumbo (PhD)
· James Bosse (undergraduate)
· Atif Rakin (undergraduate)
· Joseph Desmarais (undergraduate)
· Kathryn Czaja (undergraduate)
Alumni
· Dr. Ramesh Nath (PhD, now a post-doc
at ANL)
· Kate Bagnoli (M.S., now teaching high school)
· Dr. Minhua Zhao (post-doc, now a NRC post-doc at NIST/NIH)
· David Schuman (graduate)
·
· Ali Langston (undergraduate)
· Alexander Williams (undergraduate)
Research Interests
Develop and apply variations of Scanning Probe Microscopy (SPM) for novel nanoscale materials property measurements and mapping.
· High Speed Surface Property Mapping (HSSPM)
· Mechanical, optical, and coupled properties of biological structures
· Nanoscale current mapping for photovoltaics and LED’s
· Piezo-Force Microscopy (PFM) for piezoelectric materials
· Ultrasonic Force Microscopy (UFM) for mechanically heterogeneous systems
· Scanning Surface Potential Microscopy (SSPM) and Electric Force Microscopy (EFM) for electrically active devices and structures
· Theory of contrast mechanisms for Atomic Force Microscopy variations
· Nanofabrication and Nanomanipulation
· Nanomanipulation
IMS
NanoMeasurements Lab
The nm lab now
features three Asylum Research
Atomic Force Microscopes, one designed for further AFM technique development,
one for biological and optical studies, and the newest for high speed and high
sensitivity measurements.
· High Speed/Sensitivity: Brand new AR Cypher AFM system designed as a platform for HSSPM imaging, providing property mapping at rates of multiple frames per second. The system is coupled with extensive National Instruments PXIe based generators and data acquisition for full automation and external control via LabView software.
· Development: AR MFP3d AFM coupled with extensive test and measurement hardware for development of SPM variations. Includes: function generators; LCR meter; power supplies; 4-ch. oscilloscope; low and high speed lock in amplifiers; spectrum analyzer; thermal/humidity sensor; high speed data acquisition board; custom analysis software; and high speed actuators; computer controlled and automated with Agilent Vee.
· Bio: AR MFP3d AFM built on a Nikon TE2000 inverted microscope for simultaneous AFM and optical measurements. Includes oil-coupled 60x objective; high speed, low light, high speed, on chip amplification Hamamatsu camera; broadband illumination with filter selectable excitation; high speed excitation wavelength switching; automated objective focal adjustment; and Improvision control and analysis software for 4d optical imaging and characterization.
· We are also installing a Omicron UHV STM/AFM.
Links
· Stanford University, MS&E Department
· University of Pennsylvania, MS&E Department, Bonnell Group
· Oxford University, Department of Materials, Briggs Group
· Ecole Polytechnic Fédérale de Lausanne, IPMC, Laszlo Forro Group and Andrzej Kulik
· National Institute of Standards and Technology, Ceramics Division
Professional Organizations
· Materials
Research Society
· American
Ceramics Society, Basic
Science Division
· American Physics
Society
· SPIE
Smart Structures and Materials
· IEEE Ultrasonics, Ferroelectrics, and Frequency Control
Annual Holiday Cards
· 2004 Ferroelectric domain tree, sled, and snowman
· 2005 AFSM: Atomic Force Snowman Microscopy (Virtual Reality animation of AFM AC-imaging using a snowman’s nose as the tip, in a winter wonderland scene of course). Downloadable as a 1 or 2 player game (play nanoscale king of the snow-covered mountain!)
Funding
· National Science Foundation, Engineering Directorate, Civil, Mechanical and Manufacturing Innovation Division, Nano-Bio-Mechanics, award 0626231.
· National
Science Foundation, Directorate
for Mathematical and Physical Sciences, Division of Materials Research,
Instrumentation
for Materials Research, award 0817263.
· Department of
Homeland Security
· Army
Research Office
· UConn
Research Foundation
Lithographically defined using the AFM
4 µm x 4
µm, Topographic Contrast < 5 nm
Note: Some material is
based upon work supported by the National Science Foundation, under Grants
0626231 and 0817263. Any opinions, findings and conclusions or recommendations
expressed in this material are those of the author(s) and do not necessarily
reflect the views of the National Science Foundation (NSF).
