Elemental Analysis – Rigaku ZXS Primus IV XRF Spectrometer


Available Methods and Accessories

The ZSX Primus IV is a wavelength dispersive XRF spectrometer for qualitative, semi-quantitative, and quantitative analysis of major and minor atomic elements. It is capable of detecting from Beryllium through Uranium, with concentrations at the ppm level, in a wide variety of sample types. It is a tube above system, equipped with a powerful 4 kW Rhodium X-ray tube for quick analysis, flow proportional and scintillation counters, and an automated sample changer for up to 48 samples. It allows mapping and multi-point analysis to detect elemental homogeneity, inclusions, and distribution.

Sample Requirements

  • Powders: 5 mg – 10 g
  • Films and bulks: max. size of 50 mm (diam) x 30 mm (height)
  • Liquids: >20 mL

Summary of Technique

The WDXRF spectrometer works by irradiating a sample with an incident X-ray tube. The fluorescence coming from the sample is measured with a wavelength dispersive detection system. It uses analyzing crystals to separate the fluorescent X-rays into individual wavelengths of each element. WDXRF provides high resolution and low background spectra for the accurate determination of elemental concentrations. It features a fundamental parameters software that provides semi-quantitative analysis of almost all sample types without the use of reference standard samples.

Information Provided & Detection Limits

  • Elemental range: B-U or F-U
  • Analysis of the major (100%) and minor elements (ppm).
  • Mapping and multi-point analysis.
  • Detection limit: ppm (variable depending on the element and sample matrix)

Lab Location and Contact Information

Location: IPB X-ray Laboratory
Lab Manager: Daniela Morales