Available Methods and Accessories
- 2.5, 10, 50 x objectives
- Surface topography
- Step height
- Waviness
Sample Requirements
Less than 8” width and depth and 4” height. Samples should be reflective or able to be made reflective
Summary of Technique
Optical profilometry utilizes white light interferometry to analyze a surface. Surface reflected light creates constructive and destructive interference with a reference light beam in the detector which correlates to surface topography.
Information Provided & Detection Limits
Surface topographical constraints: Average roughness, waviness, step height
Lab Location and Contact Information
Lab Location: Mechanical Testing Lab
Lab Manager: Nicholas Eddy
nicholas.eddy@uconn.edu
860-486-2568