Surface Profilometry – Zygo New View 5000


Available Methods and Accessories

  • 2.5, 10, 50 x objectives
  • Surface topography
  • Step height
  • Waviness

Sample Requirements

Less than 8” width and depth and 4” height. Samples should be reflective or able to be made reflective

Summary of Technique

Optical profilometry utilizes white light interferometry to analyze a surface. Surface reflected light creates constructive and destructive interference with a reference light beam in the detector which correlates to surface topography.

Information Provided & Detection Limits

Surface topographical constraints: Average roughness, waviness, step height

Lab Location and Contact Information

Lab Location: Mechanical Testing Lab
Lab Manager: Nicholas Eddy